X'Pert Pro Alpha-1
by PANalytical Inc.
The X'Pert Pro Alpha-1 diffraction system is suitable for solving structures from powder data, searching for polymorphic phases where peak overlap is a hinderance, studying nanomaterial peak profiles to extract crystallite size, dislocation densities and preparing materials for synchrotron beam time
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| Published: | 2008 |
| Format: | |
| Length: | 8 pages |
| Type: | Product Collateral |
| Language: | English |
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